STANFORD RESEARCH SYSTEMS SR785 REPAIR and STANFORD RESEARCH SYSTEMS SR785 CALIBRATION
 
Custom-Cal has a high success rate in the repair of the STANFORD RESEARCH SYSTEMS SR785. A calibration by Custom-Cal is performed by engineers with extensive OEM experience. We have the expertise and the necessary standards to perform the STANFORD RESEARCH SYSTEMS SR785 Calibration, onsite calibration may be available. We specialize in quick turnaround times and we can handle expedited deliveries upon request.

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   STANFORD RESEARCH SYSTEMS SR785   Description / Specification:    
STANFORD RESEARCH SYSTEMS SR785 Two-Channel Dynamic Signal Analyzer

The SRS SR785 Two-Channel Dynamic Signal Analyzer is a precision, full-featured signal analyzer that offers state-of-the-art performance at a price that's less than half that of competitive analyzers. Building on its predecessor, the SR780, the SR785 incorporates new firmware and hardware that make it the ideal instrument for analyzing both mechanical and electrical systems. For measurements involving servo systems, control systems, acoustics, vibration testing, modal analysis, or machinery diagnostics, the SR785 has the features and specifications to get the job done. Standard measurement groups include FFT, order tracking, octave, swept-sine, correlation, time capture, and time/histogram. The SRS SR785 brings the power of several instruments to your application: a spectrum analyzer, network analyzer, vibration analyzer, octave analyzer and oscilloscope. Specifications. Frequency Range: 102.4 kHz or 100 kHz (both displays have the same range). FFT spans: 195.3 mHz to 102.4 kHz or 191 mHz to 100 kHz. The two displays can have different spans and start frequencies. FFT resolution: 100, 200, 400 or 800 lines. Dynamic range: 90 dB typical, 80 dB guaranteed (FFT and Octave). 145 dB typical (Swept-Sine). Includes spurs, harmonics, intermodulation distortion, and alias products. Excludes alias responses at extremes of span. Harmonic distortion: <-80 dB (single tone in band). Amplitude Accuracy Single channel: ±0.2 dB (excluding window effects). Phase Accuracy Single channel: ±3.0 deg. relative to external TTL trigger (-50 dBfs to 0 dBfs, freq <10.24 kHz, center of frequency bin, DC coupled). For Blackman-Harris, Hanning, Flat-Top and Kaiser windows, phase is relative to a cosine wave at center of time record. For Uniform, Force and Exponential windows, phase is relative to a cosine wave at beginning of the time record. Number of inputs: 2. Full-scale input range: -50 dBV (3.16 mVp) to +34 dBV (50 Vp) in 2 dB steps. Maximum input level: 57 Vp. Source Output Amplitude range: 0.1 mVp to 5 Vp. Amplitude resolution: 0.1 mVp.



 

Standard Calibration $475.00 *
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*This is a Web introductory price for one calibration of the STANFORD RESEARCH SYSTEMS SR785. Price does not in most cases include measurement performance data. Pricing does include NIST traceable calibration and issue of a calibration certificate and calibration label. Pricing may vary slightly due to volume and location of laboratory supporting calibration. Volume pricing may apply. On-site fees may apply depending on logistics, location and volume of work to be completed during the visit.


Related Bench Equipment Terms and Definitions. For a complete list go to our  Terms and Definitions Page.

Average Power
Average power means that the energy transfer rate is to be averaged over many periods of the lowest frequency involved. For a CW signal, the lowest frequency and highest frequency are the same, so average power and power are the same. For an amplitude modulated wave, the power must be averaged over many periods of the modulation component of the signal as well.

Dynamic range
Dynamic range the ratio of a specified maximum level of a parameter, such as power, current, voltage or frequency, to the minimum detectable value of that parameter.

Modulation
Modulation is the process by which the characteristic of one wave (the carrier) is modified by another.

Repeatability
Repeatability is the variation in a number of repeated measured quantities when measurement conditions are changed and restored. The value corresponds to half the spread between the minimum and maximum value measured.

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